美国 · 品目· 6 个子目· 24 个税号
9031未列名测量或检验仪器、器具及机器；轮廓投影仪
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors
子目（6 位 WCO 统一）
美国税号（10 位）
本品目下 美国海关的全部细分税号与首要税率
| HS 编码 | 商品描述 | 首要税率 |
|---|---|---|
| 9031.10.00.00 | Machines for balancing mechanical parts | Free |
| 9031.20.00.00 | Test benches | 1.7% |
| 9031.41.00 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free |
| 9031.41.00.20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | Free |
| 9031.41.00.40 | For wafers | Free |
| 9031.41.00.60 | Other | Free |
| 9031.49.10.00 | Profile projectors | Free |
| 9031.49.40.00 | Coordinate-measuring machines | Free |
| 9031.49.70.00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | Free |
| 9031.49.90.00 | Other | Free |
| 9031.80.40.00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | Free |
| 9031.80.80 | Other | Free |
| 9031.80.80.60 | For testing electrical characteristics | Free |
| 9031.80.80.70 | Other | Free |
| 9031.80.80.85 | Other | Free |
| 9031.90.21.00 | Of profile projectors | Free |
| 9031.90.45.00 | Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | Free |
| 9031.90.54.00 | Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 | Free |
| 9031.90.59.00 | Other | Free |
| 9031.90.70.00 | Of articles of subheading 9031.80.40 | Free |
| 9031.90.91 | Other | Free |
| 9031.90.91.30 | Of machines for balancing mechanical parts | Free |
| 9031.90.91.60 | Of test benches | Free |
| 9031.90.91.95 | Other | Free |