WCO 分类路径
- 章90光学、测量、医疗仪器
- 品目9031未列名测量或检验仪器、器具及机器；轮廓投影仪
- 子目903180其他仪器、器具及机器
- 国家码9031.80.40.00Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles
9031.80.40.00
"Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles"
HS 编码 9031.80.40.00（第 90 章「光学、测量、医疗仪器」；品目 9031「未列名测量或检验仪器、器具及机器；轮廓投影仪」；子目 903180「其他仪器、器具及机器」）在美国税则中对应"Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles"。美国海关对该编码商品征收最惠国税率 (MFN) Free、第二栏税率 40%。法定计量单位为No.。
税率清单
| 类别 | 税率 |
|---|---|
最惠国税率 (MFN) MFN rate | Free |
第二栏税率 Column 2 rate | 40% |
同一 HS 6 位前缀 9031.80 在其他国家的税率对照