WCO 分类路径

章90光学、测量、医疗仪器
品目9031未列名测量或检验仪器、器具及机器；轮廓投影仪
子目903141用于检查半导体晶圆、器件、光掩模或网版
国家码9031.41.00For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

9031.41.00

现行

"For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)"

HS 编码 9031.41.00（第 90 章「光学、测量、医疗仪器」；品目 9031「未列名测量或检验仪器、器具及机器；轮廓投影仪」；子目 903141「用于检查半导体晶圆、器件、光掩模或网版」）在美国税则中对应"For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)"。美国海关对该编码商品征收最惠国税率 (MFN) Free、第二栏税率 50%。