WCO 分类路径

章90光学、测量、医疗仪器
品目9031未列名测量或检验仪器、器具及机器；轮廓投影仪AI 译
子目903141用于检查半导体晶圆、器件、光掩模或网版AI 译
国家码9031.41.00- - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

9031.41.00

现行

"- - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)"

HS 编码 9031.41.00（第 90 章「光学、测量、医疗仪器」；品目 9031「未列名测量或检验仪器、器具及机器；轮廓投影仪」；子目 903141「用于检查半导体晶圆、器件、光掩模或网版」）在菲律宾税则中对应"- - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)"。