WCO 分类路径

章90光学、测量、医疗仪器
品目9031未列名测量或检验仪器、器具及机器；轮廓投影仪AI 译
子目903141用于检查半导体晶圆、器件、光掩模或网版AI 译
国家码90314100For inspecting semiconductor wafers, or devices(including integrated circuits) or for inspecting photo-masks or reticules used in manufacturing semiconductor devices(including integrated circuits)

90314100

现行

"For inspecting semiconductor wafers, or devices(including integrated circuits) or for inspecting photo-masks or reticules used in manufacturing semiconductor devices(including integrated circuits)"

HS 编码 90314100（第 90 章「光学、测量、医疗仪器」；品目 9031「未列名测量或检验仪器、器具及机器；轮廓投影仪」；子目 903141「用于检查半导体晶圆、器件、光掩模或网版」）在印度税则中对应"For inspecting semiconductor wafers, or devices(including integrated circuits) or for inspecting photo-masks or reticules used in manufacturing semiconductor devices(including integrated circuits)"。印度海关对该编码商品征收基本关税 (BCD) 0、IGST 18。法定计量单位为u。该商品涉及 1 项进口管理规定或禁限措施，详见合规章节。