6 位 WCO 子目 · 全球统一
903141用于检查半导体晶圆、器件、光掩模或网版
For inspecting semiconductor wafers, or devices(including integrated circuits) or for inspecting photo-masks or reticules used in manufacturing semiconductor devices(including integrated circuits)
12 国进口税率对照
HS 子目 903141 在 12 个主要贸易管辖区的首要进口税率对照
日本 具体税号
1 个细分税号
| HS 编码 | 商品描述 | 首要税率 |
|---|---|---|
| 903141000 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free |