WCO 分类路径
- 章90光学、测量、医疗仪器
- 品目9031未列名测量或检验仪器、器具及机器;轮廓投影仪
- 子目903149其他
- 国家码9031.49.10- - - Optical instruments and appliances for measuring surface particulate contamination on semiconductor wafers
9031.49.10
"- - - Optical instruments and appliances for measuring surface particulate contamination on semiconductor wafers"
HS 编码 9031.49.10(第 90 章「光学、测量、医疗仪器」;品目 9031「未列名测量或检验仪器、器具及机器;轮廓投影仪」;子目 903149「其他」)在菲律宾税则中对应"- - - Optical instruments and appliances for measuring surface particulate contamination on semiconductor wafers"。
同一 HS 6 位前缀 9031.49 在其他国家的税率对照